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Showing items 1-10 of 40 (4 Page(s) Totally)
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| 臺大學術典藏 |
2021-09-02T00:04:10Z |
Systematic Hold-time Fault Diagnosis and Failure Debug in Production Chips
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Liu C.-Y;Wu M.-T;Li J.C.-M;Bhargava G;Nigh C.; Liu C.-Y; Wu M.-T; Li J.C.-M; Bhargava G; Nigh C.; CHIEN-MO LI |
| 臺大學術典藏 |
2021-09-02T00:04:09Z |
Diagnosis technique for Clustered Multiple Transition Delay Faults
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You Y.-S;Liu C.-Y;Wu M.-T;Chen P.-W;Li J.C.-M.; You Y.-S; Liu C.-Y; Wu M.-T; Chen P.-W; Li J.C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2021-09-02T00:04:09Z |
High Efficiency and Low Overkill Testing for Probabilistic Circuits
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Lee M.-T;Wu C.-H;Liu S.-T;Hsieh C.-Y;Li J.C.-M.; Lee M.-T; Wu C.-H; Liu S.-T; Hsieh C.-Y; Li J.C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2021-09-02T00:04:09Z |
QATG: Automatic Test Generation for Quantum Circuits
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Wu C.-H;Hsieh C.-Y;Li J.-Y;Li J.C.-M.; Wu C.-H; Hsieh C.-Y; Li J.-Y; Li J.C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-30T02:49:18Z |
An accurate timing-aware diagnosis algorithm for multiple small delay defects
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Chen P.-J. ;Wei-Li Hsu ;Li J.C.-M. ;Tseng N.-H. ;Chen K.-Y. ;Changchien W.-P. ;Liu C.C.C.; Chen P.-J.; WEI-LI HSU; Li J.C.-M.; Tseng N.-H.; Chen K.-Y.; Changchien W.-P.; Liu C.C.C. |
| 臺大學術典藏 |
2020-06-29T01:20:17Z |
Automatic test pattern generation
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Cheng, K.-T.T.;Wang, L.-C.;Li, H.;Li, J.C.-M.; Cheng, K.-T.T.; Wang, L.-C.; Li, H.; Li, J.C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:15Z |
Robust test pattern generation for hold-time faults in nanometer technologies
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Chen, Y.-W.; Chang, C.-M.; Yang, K.-C.; Li, J.C.-M.; CHIEN-MO LI; Ho, Y.-H.; Ho, Y.-H.;Chen, Y.-W.;Chang, C.-M.;Yang, K.-C.;Li, J.C.-M. |
| 臺大學術典藏 |
2020-06-29T01:20:15Z |
Parallel order ATPG for test compaction
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Chen, Y.-W.;Ho, Y.-H.;Chang, C.-M.;Yang, K.-C.;Li, M.-T.;Li, J.C.-M.; Chen, Y.-W.; Ho, Y.-H.; Chang, C.-M.; Yang, K.-C.; Li, M.-T.; Li, J.C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:15Z |
ATPG and test compression for probabilistic circuits
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Wu, C.-H.; Li, J.C.-M.; CHIEN-MO LI; Yang, K.-C.;Lee, M.-T.;Wu, C.-H.;Li, J.C.-M.; Yang, K.-C.; Lee, M.-T. |
| 臺大學術典藏 |
2020-06-29T01:20:14Z |
Test methodology for PCHB/PCFB Asynchronous Circuits
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Shen, T.-Y.;Pai, C.-C.;Chen, T.-C.;Li, J.C.-M.;Pan, S.; Shen, T.-Y.; Pai, C.-C.; Chen, T.-C.; Li, J.C.-M.; Pan, S.; CHIEN-MO LI |
Showing items 1-10 of 40 (4 Page(s) Totally)
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